This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to. This book aims to provide examples of applications of atomic force microscopy ( AFM) using biological samples, showing different methods for atomic force. This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully .
|Language:||English, Spanish, Portuguese|
|Genre:||Politics & Laws|
|ePub File Size:||23.61 MB|
|PDF File Size:||16.76 MB|
|Distribution:||Free* [*Sign up for free]|
Atomic Force Microscopy: Understanding Basic Modes and Advanced This book enlightens readers on the basic surface properties and. "This book can be called a practical introduction to atomic force microscopy (AFM ). It is outstanding among those written on this subject. I have worked with AFM. The atomic force microscope (AFM) is a highly interdisciplinary instrument that and Research Course in AFM (with the combination of book and online videos).
This book touches on all the points and issues that are critical to understanding the proximity microscopy. These include instrumentation, measurement modes, familiarization with the images, the routine procedures for image processing, one section devoted to artefacts and finally potential applications of the technique.
From my point of view, is one of the books on microscopy of proximity, which is easier to read and with a high applicability in measuring routines. The book by Peter Eaton and Paul West is a great help in this situation. It documents all the properties, advantages, problems and pitfalls of atomic force microscopy, as well as many of its applications.
The first two-thirds of the work is a manual, the last third shows examples of possible applications. After an overview of the fundamentals of the AFM instrumentation, the two authors treat and explain the common imaging modes in atomic force microscopy in words, diagrams and example measurements.
For each measurement mode you will find instructions on how to prepare the microscope and how to perform the data acquisition. As with any real instrument, there are a whole range of potential errors when measuring with an AFM.
The causes can be intrinsically in the device, but also due to incorrect parameter selection. Eaton and West use sample measurements to show how nonlinearities, contaminated probes, and wrong control parameters affect. The pictures and texts are helpful for recognizing many recoverable problems.
As a rule, the measured data are to be processed and displayed using various rendering methods. Compared to classic scanning electron microscopy SEM , it allows to imaging of dielectric material surfaces without the need for applying conductive layers and allows the determination of surface roughness parameters without the need for additional tests. Therefore, this method is still being developed and is recognized in many areas of science and technology.
The special significance of AFM is emphasized in the research on the surface quality of functional materials, using the possibility of surface analysis at the nanometric level.
The field of AFM applications, due to the enormous possibilities unavailable to other research techniques, is constantly expanded [ 1 , 2 , 3 , 4 ]. The idea of AFM is based on the use of interatomic short-range interactions whose intensity depends on the surface topography of the test sample subjected to the research.
The analysis of the surface in terms of the shape and location of characteristic points most often carried out by means of AFM is in three modes [ 5 , 6 , 7 ].
However, the limitation of the use of the mode in the case of materials with low hardness thin organic layers is the need to apply low-pressure forces by danger of damaging the sample [ 5 ]. In the dynamic-resonance mode long-range attraction microscopy—van der Waals forces, magnetic forces, electrostatic forces , i.
The mode provides lower resolution of images than in the contact mode; however, it can be used to analyze the surface of materials with very low hardness and easily deformable [ 6 ]. A common feature of all available modes is the method of image creation as a result of measuring the forces occurring between the microprobe and the surface under test.
The microsphere is placed on a springy lever beam which is bent under the influence of interatomic forces. Deflection of the beam is processed by the photodetector for a current signal, which allows obtaining a surface image of the sample.
Due to the specificity of surface imaging, AFM is effective for virtually all groups of engineering materials.
download Hardcover. FAQ Policy. About this book This book aims to provide examples of applications of atomic force microscopy AFM using biological samples, showing different methods for AFM sample preparation, data acquisition and processing, and avoiding technical problems.
Show all. Pages Ligand-Receptor Binding on Cell Membrane: Single-Molecule Force Spectroscopy: